Hardware-Assisted Verification for Multi-Die Designs

Enabling Scalable Silicon-to-System Validation

Accelerate Multi-Die Verification with Hardware-Assisted Validation

As semiconductor architectures continue to evolve toward multi-die designs, verification complexity increases dramatically. Traditional verification methods struggle to validate distributed architectures, software interactions, and cross-die communication at the scale required for modern systems.

Download this exclusive Synopsys white paper to discover how Hardware-Assisted Verification (HAV) enables engineering teams to validate complex multi-die designs faster, improve debug efficiency, and accelerate software bring-up while reducing verification risk.

What You'll Learn

After reading this white paper, you'll understand how to:

• Address the growing verification challenges of multi-die designs  architectures.
• Validate cross-die communication and interconnect behavior.
• Execute long-running software workloads before silicon availability.
• Scale verification using emulation and FPGA prototyping.
• Improve system-level validation while maintaining deep debug visibility.
• Accelerate software development and reduce overall time-to-market.